Multichip package with protocol-configurable data paths

ABSTRACT

Integrated circuit packages with multiple integrated circuit dies are provided. A multichip package may include a substrate, a main die that is mounted on the substrate, and multiple transceiver daughter dies that are mounted on the substrate and that are coupled to the main die via corresponding Embedded Multi-die Interconnect Bridge (EMIB) interconnects formed in the substrate. Each of the main die and the daughter dies may include configurable adapter circuitry for interfacing with the EMIB interconnects. The adapter circuitry may include FIFO buffer circuits operable in a 1× mode or 2× mode and configurable in a phase-compensation mode, a clock-compensation mode, an elastic mode, and a register bypass mode to help support a variety of communications protocols with different data width and clocking requirements. The adapter circuitry may also include boundary alignment circuitry for reconstructing (de)compressed data streams.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.17/131,474, filed Dec. 22, 2020, entitled, “MULTICHIP PACKAGE WITHPROTOCOL-CONFIGURABLE DATA PATHS,” which is a continuation of U.S.patent application Ser. No. 16/436,771, filed Jun. 10, 2019, entitled,“MULTICHIP PACKAGE WITH PROTOCOL-CONFIGURABLE DATA PATHS,” which is acontinuation of U.S. patent application Ser. No. 14/975,270, filed Dec.18, 2015, now U.S. Pat. No. 10,394,737, entitled “MULTICHIP PACKAGE WITHPROTOCOL-CONFIGURABLE DATA PATHS,” the disclosures of which areincorporated by reference in their entireties for all purposes.

BACKGROUND

This relates generally to integrated circuit packages, and moreparticularly, to integrated circuit packages with more than oneintegrated circuit die.

An integrated circuit package typically includes an integrated circuitdie and a substrate on which the die is mounted. The die can be coupledto the substrate through bonding wires or solder bumps. Signals from theintegrated circuit die may then travel through the bonding wires orsolder bumps to the substrate.

As demands on integrated circuit technology continue to outstrip eventhe gains afforded by ever decreasing device dimensions, more and moreapplications demand a packaged solution with more integration thanpossible in one silicon die. In an effort to meet this need, more thanone die may be placed within a single integrated circuit package (i.e.,a multichip package). As different types of devices cater to differenttypes of applications, more dies may be required in some systems to meetthe requirements of high performance applications. Accordingly, toobtain better performance and higher density, an integrated circuitpackage may include multiple dies arranged laterally along the sameplane or may include multiple dies stacked on top of one another.

Emerging trends that would rely on the advantages offered by multichippackages include increasing demands of data centers, the explosion ofInternet of Things (IoT), 400G to terabit networking, optical transport,5G wireless technology, 8K video streaming, etc. These next generationplatforms require semiconductor systems that offer higher bandwidth,increased functionality, and increased flexibility while minimizingpower consumption and maintaining or reducing its footprint/form factor.These requirements present fairly challenging problems to the systemdesigner.

Conventional multichip packages include multiple dies mounted on aninterposer substrate. The use of interposer substrates are, however,oftentimes prohibitively costly to manufacture while also being prone tomechanical issues such as warpage. Interposers sometimes include logicrouting fabric for interconnecting the different dies, oftentimesresulting in much longer interconnects, which increases the loading onthe driver buffers and limits performance. Moreover, conventionalmultichip packages that are used in high-speed networking systems (e.g.,networking applications that support data transfers of 10 Gbps or more)often have limited flexibility and can only support a single networkingprotocol.

It is within this context that the embodiments described herein arise.

SUMMARY

A multichip package that includes at least a first integrated circuit(IC) die (e.g., a main programmable integrated circuit die) coupled to asecond IC die (e.g., a auxiliary transceiver die) via Embedded Multi-dieInterconnect Bridge (EMIB) interconnects is provided. In accordance withan embodiment, the first integrated circuit die may include configurableadapter circuitry that supports a variety of different communicationsprotocols having different data width requirements.

The configurable adapter circuitry on the first IC die may include afirst FIFO (first-in first-out) circuit (e.g., a transmit FIFO buffercircuit) having a first data port that supports a fixed data width and asecond data port that supports an adjustable data width. The first FIFOcircuit has a read clock input that receives a read clock signal and awrite clock input that receives a write clock signal. The first FIFOcircuit is operable in a first (1×) mode in which the read and writeclock signals have identical frequencies and in a second (2×) mode inwhich the read and write clock signals have different frequencies.

The configurable adapter circuitry may further include a second FIFOcircuit (e.g., a receive FIFO buffer circuit) having a first data portthat supports the fixed data width and a second data port that supportsthe adjustable data width. The second FIFO circuit is also operable inthe first and second modes.

The second integrated circuit die may also be provided with additionalconfigurable adapter circuitry that includes a third FIFO circuit havinga first data port that supports the fixed data width and a second dataport that supports the adjustable data width and a fourth FIFO circuithaving a first data port that supports the fixed data width and a seconddata port that supports the adjustable data width. The third and fourthFIFO circuits are also operable in the first and second modes.

When the first integrated circuit die is operated in the first mode, thesecond data ports of the first and second FIFO circuits are configuredto support the fixed data width. When the first integrated circuit dieis operated in the second mode, the second data ports of the first andsecond FIFO circuits are configured to support an adjusted data widththat is at least two times greater than the fixed data width. When thesecond integrated circuit die is operated in the first mode, the seconddata ports of the third and fourth FIFO circuits are configured tosupport the fixed data width. When the second integrated circuit die isoperated in the second mode, the second data ports of the third andfourth FIFO circuits are configured to support an adjusted data widththat is at least two times greater than the fixed data width.

During a first period, the first and second integrated circuit dies maybe simultaneously operated in the first mode. During a second periodthat is different than the first period, the first and second integratedcircuit dies may be simultaneously operated in the second mode. During athird period that is different than the first and second periods, thefirst integrated circuit die may be operated in different modes (e.g.,the first IC die may be operated in the first mode while the secondintegrated circuit die is operated in the second mode, and vice versa).

The FIFO circuits are also configurable in a phase-compensation modethat provides phase compensation for the write and read clock signalscontrolling the FIFO circuits, a clock-compensation mode that providesclock frequency compensation for the write and read clock signals onlyduring the second mode, an elastic mode that throttles the amount ofdata being conveyed through the FIFO circuits, and a register mode thatselectively bypassed one or more of the FIFO circuits.

Further features of the present invention, its nature and variousadvantages will be more apparent from the accompanying drawings and thefollowing detailed description.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a diagram of an illustrative system of integrated circuitdevices operable to communicate with one another in accordance with anembodiment.

FIG. 2 is a diagram of an illustrative programmable integrated circuitin accordance with an embodiment.

FIG. 3 is a top view of an illustrative multichip package that includesa main die coupled to multiple transceiver daughter dies in accordancewith an embodiment.

FIG. 4 is a cross-sectional side view of an illustrative multichippackage that includes a main die coupled to multiple transceiverdaughter dies via embedded package interconnect structures in accordancewith an embodiment.

FIG. 5 is a diagram showing adapter circuitry that can be used tosupport a variety of different communications protocols in a multichippackage in accordance with an embodiment.

FIG. 6 is a diagram showing how the adapter circuitry of FIG. 5 can beused to support multiple data widths in accordance with an embodiment.

FIG. 7 is a diagram showing different configuration modes in whichfirst-in first-out (FIFO) circuits in the adapter circuitry of FIG. 5can be operated in accordance with an embodiment.

FIG. 8 is a diagram showing how the adapter circuitry of FIG. 5 can beused to support 1× mode in accordance with an embodiment.

FIG. 9 is a diagram showing how the adapter circuitry of FIG. 5 can beused to support 2× mode in accordance with an embodiment.

FIG. 10 is a diagram showing how the adapter circuitry of FIG. 5 can beused to support a hybrid 1×/2× mode in accordance with an embodiment.

FIG. 11 is a diagram showing how the adapter circuitry of FIG. 5 can beused to support register mode in accordance with an embodiment.

DETAILED DESCRIPTION

Embodiments of the present invention relate to integrated circuits, andmore particularly, to ways of supporting synchronous data path transferbetween multiple dies within a multichip package.

As integrated circuit fabrication technology scales towards smallerprocess nodes, it becomes increasingly challenging to design an entiresystem on a single integrated circuit die (sometimes referred to as asystem-on-chip). Designing analog and digital circuitry to supportdesired performance levels while minimizing leakage and powerconsumption can be extremely time consuming and costly.

One alternative to single-die packages is an arrangement in whichmultiple dies are placed within a single package. Such types of packagesthat contain multiple interconnected dies may sometimes be referred toas systems-in-package (SiPs), multi-chip modules (MCM), or multichippackages. Placing multiple chips (dies) into a single package may alloweach die to be implemented using the most appropriate technology process(e.g., a memory chip may be implemented using the 28 nm technology node,whereas the radio-frequency analog chip may be implemented using the 45nm technology node), may increase the performance of die-to-dieinterface (e.g., driving signals from one die to another within a singlepackage is substantially easier than driving signals from one package toanother, thereby reducing power consumption of associated input-outputbuffers), may free up input-output pins (e.g., input-output pinsassociated with die-to-die connections are much smaller than pinsassociated with package-to-board connections), and may help simplifyprinted circuit board (PCB) design (i.e., the design of the PCB on whichthe multi-chip package is mounted during normal system operation).

Consider a scenario in which a multichip package includes a firstintegrated circuit (IC) die and a second IC die mounted on a commonsubstrate. The first and second IC dies may be attached to the substratein a flip-chip orientation in which a finite number of solder bumps areformed between the IC dies and the substrate. Each solder bump isconnected to a corresponding input/output (IO) pin on the first IC dieand a corresponding IO pin on the second IC die. Due to areaconstraints, a single communications channel may include only a finitenumber of IO pins.

For example, a single channel may have only eighty pins that can be usedfor synchronous data path transfer. In this scenario, a first group offorty pins can be used for transmission while a second group of fortypins can be used for reception (i.e., only forty pins per direction areavailable in each channel). This limitation might be tolerable if thechannel can support the required data transfer requirement at the systemclock rate of either the first or second IC die. However, certaincommunications protocols will require a higher data transfer criteriathat cannot be supported by only forty pins operating at the systemclock rate.

In accordance with embodiments of the present invention, circuitry isprovided that can be used to transfer data synchronously between IC diesin a multichip package and that can be configured to support a varietyof different communications protocols with different data path widthrequirements and/or frequency requirements. The circuitry may includeadapter circuitry that includes configurable buffer circuits (e.g.,first-in first-out circuits) that are operable in a normal “1×” mode forsupporting relatively lower data transfer rates (e.g., to supportprotocols that do not require more than the available number of IO pinsper channel) and a (de)compression “2×” mode for supporting relativelyhigher data transfer rates (e.g., to support protocols that requiredmore than the available number of IO pins per channel).

Depending on the requirements of the particular protocol that the systemis currently supporting, the buffer circuits can be configured in atleast a phase compensation mode that handles read/write operations usingclocks with different phases, a clock compensation mode that handlesread/write operations using clocks with different frequencies, anelastic mode that helps prevent buffer overflow and underflow, and aregister mode that provides reduced latency.

The adaptive circuitry described above may be use as an interfacebetween one or more integrated circuit dies in a system. FIG. 1 is adiagram of an illustrative system 100 of interconnected electronicdevices. The system of interconnected electronic devices may havemultiple electronic devices such as device A, device B, device C, deviceD, and interconnection resources 102. Interconnection resources 102 suchas conductive lines and busses, optical interconnect infrastructure, orwired and wireless networks with optional intermediate switchingcircuitry may be used to send signals from one electronic device toanother electronic device or to broadcast information from oneelectronic device to multiple other electronic devices. For example, atransmitter in device B may transmit data signals to a receiver indevice C. Similarly, device C may use a transmitter to transmit data toa receiver in device B.

The electronic devices may be any suitable type of electronic devicethat communicates with other electronic devices. Examples of suchelectronic devices include basic electronic components and circuits suchas analog circuits, digital circuits, mixed-signal circuits, circuitsformed within a single package, circuits housed within differentpackages, circuits that are interconnected on a printed-circuit board(PCB), etc.

In accordance with an embodiment, an integrated circuit may be aprogrammable integrated circuit such as programmable integrated circuit10 of FIG. 2 . Programmable integrated circuit 10 may be configured toimplement a variety of different functions and may therefore benefitfrom interface circuitry that is capable of supporting differentcommunications protocols and data rates.

As shown in FIG. 2 , integrated circuit 10 may contain memory elements20. Memory elements 20 may be loaded with configuration data toconfigure programmable transistors such as pass transistors (sometimesreferred to as pass gates or pass gate transistors) in programmablecircuitry such as programmable logic 18.

Because memory elements 20 may be used in storing configuration data forprogrammable logic 18, memory elements 20 may sometimes be referred toas configuration random-access memory (CRAM) cells. Integrated circuit10 may be configured to implement custom logic functions by configuringprogrammable logic 18. As a result, integrated circuit 10 may sometimesbe referred to as a programmable integrated circuit or a programmablelogic device (PLD) integrated circuit.

As shown in FIG. 1 , programmable integrated circuit 10 may haveinput-output (I/O) circuitry 12 for driving signals off of device 10 andfor receiving signals from other devices via input-output pins 14.Interconnection resources 16 such as global and local vertical andhorizontal conductive lines and buses may be used to route signals ondevice 10. Interconnection resources 16 may include fixed interconnects(conductive lines) and programmable interconnects (i.e., programmableconnections between respective fixed interconnects).

A key challenge in designing programmable integrated circuits is theneed to provide flexibility while providing high-speed connectivitybetween devices. In an effort to meet this demand, a heterogeneousmultichip package such as package 300 is provided that decouples thetransceiver components from the core logic fabric die (see, e.g., FIG. 3). As shown in FIG. 3 , multichip package 300 includes a main die 302that includes the core logic circuitry and multiple transceiver (XCVR)dies 304 that are coupled to main die 302 via interconnect paths 306. Ingeneral, main die 302 may be a programmable integrated circuit such as aprogrammable logic device, a central processing unit (CPU), a graphicsprocessing unit (GPU), an ASIC, or other suitable integrated circuit.Main die 302 may be coupled to any number of transceiver dies 304 withinpackage 300.

Configured in this way, transceiver dies 304 and main die 302 need notbe manufactured on the same process node, which enables an in-packageintegration scheme that is easily scalable and allows designers toquickly mix-and-match components from different process nodes that bestsuit customers' need. Using separate proven transceiver dies 304 ratherthan on-chip transceivers can also help significantly reduce validationand bring-up times and dramatically improve customers' time-to-marketmetrics. Transceiver dies 304 may each be a hard IP (intellectualproperty) block that is capable of supporting communications protocolsincluding but not limited to current and future versions of Ethernet,Interlaken, PCIe, IEEE 1588, CPRI (Common Public Radio Interface), etc.

FIG. 4 shows a cross-sectional side of an exemplary multichip package300 of the type described in connection with FIG. 3 . As shown in FIG. 4, package 300 may include a substrate 400, main die 302 mounted onsubstrate 400, at least first and second auxiliary or “daughter” dies304-1 and 304-2 mounted on substrate 400, and a package lid 402 thatcovers and protects package 300. Flip-chip (otherwise known ascontrolled collapse chip connection or “C4”) bumps 404 may be formedbetween substrate 400 and the various dies 302 and 304 mounted onsubstrate 400. An array of solder balls 406 (sometimes referred tocollectively as a ball grid array or “BGA”) may be formed at the bottomsurface of package substrate 400. Package 300 formed in this way maythen be mounted on a printed circuit board (PCB) 410 to communicate withother devices in the system.

Daughter dies 304-1 and 304-2 (e.g., transceiver IP blocks described inconnection with FIG. 3 , memory blocks, CPUs, etc.) may be routed tosolder balls 406 via standard package traces 408. In accordance with anembodiment, main die 302 may communicate with daughter dies 304 using anEmbedded Multi-die Interconnect Bridge (EMIB) solution that is designedand patented by INTEL Corporation. As shown in FIG. 4 , EMIB 420 is asmall silicon chip that is embedded in the underlying package substrate400 and offers dedicated ultra-high-density interconnection between dieswithin multichip package 300. The EMIBs 420 generally include shortwires, which help to significantly reduce loading at output drivers anddirectly boost performance. This solution may be advantageous over othermultichip packaging schemes that use a silicon interposer, which isprone to issues such as warpage and requires a large number ofmicrobumps and through-silicon vias (TSVs) to be formed within theinterposer, thereby reducing overall yield and increasing manufacturingcomplexity and cost. The number of dies that can be integrated using aninterposer is also limited compared to that supported by the EMIBtechnology.

Each EMIB 420 may include wires that collectively serve as a bus thatincludes one or more channels between main die 302 and a correspondingdaughter die 304. One constraint of EMIBs is that the number of EMIBmicrobumps is limited (sometimes to only one edge of the substrate), andit is within this context that the embodiments of the invention arise.

FIG. 5 is a diagram that shows circuitry associated with a single EMIBchannel. In general, each daughter die 304 may communicate with main die302 over any suitable number of channels (e.g., via 10 or more channels,via 20 or more channels, via 50 or more channels, etc.).

Each channel may include interconnect paths for carrying different typesof data. For example, a first group of interconnect paths may be used toconvey asynchronous serial data, whereas a second group of interconnectpaths may be used to convey time-domain-multiplexed (TDM) memory mappeddata for programming the main die. FIG. 5 shows only a third group ofinterconnect paths 420, which are used to convey source synchronousdata. Paths 420 are therefore sometimes referred to here as synchronousdata paths in which clock and data travel in the same direction.

There may only be a limited number of synchronous data paths 420available between dies 302 and 304 in each channel. Consider a scenarioin which only n synchronous data paths 420 are available between dies302 and 304 per channel, n/2 data paths 420-1 may be apportioned totransmit data from main die 302 to daughter die 304 while n/2 data paths420-1 may be apportioned to receive data from daughter die 304 at maindie 302. For example, if each channel includes only eighty availablepins dedicated to source synchronous data transfer, a first group offorty pins may be used by the transmit (TX) paths 420-1 whereas a secondgroup of forty pins may be used by the receive (RX) paths 420-2.

Still referring to FIG. 5 , main die 302 may include adapter circuitry502 that selectively provides data compression. Main die adaptercircuitry 502 may include a transmit FIFO (first-in first-out) circuit504, word marking logic 512 associated with the transmit FIFO 504, areceive FIFO circuit 510, and word alignment logic 518 associated withthe receive FIFO 510. Transmit FIFO 504 and receive FIFO 510 areconfigured to buffer outgoing and incoming data, respectively, and areeach controlled by a write enable signal wr_en, a read enable signalrd_en, a write clock signal wr_clk, and a read clock signal rd_clk. Thewrite clock for TX FIFO 504 may be a first system clock that is providedfrom the core region of main die 302, whereas the read clock for RX FIFO504 may be a second system clock that is provide from the core region ofmain die 302. The first and second system clocks may be the same clockor may be different clock signals.

In accordance with an embodiment, FIFO 504 may be operated in a first“1×” mode, where signals rd_clk and wr_clk exhibit the same frequency.Since the read and write clock frequencies are identical, the data widthat the input and output of FIFO 504 are both set at n/2 in the 1× mode.

In scenarios where the data width at the input of FIFO 504 needs to begreater than n/2, FIFO 504 may be operated in a second “2×” mode, wheresignal rd_clk exhibits twice the frequency of signal wr_clk. Configuredin this way, the data width at the input of FIFO 504 is doubled to n, sothe data width across paths 420-1 is effectively cut in half relative tothe data width at the input of FIFO 504. The use of a read clock signalrd_clk running at double the corresponding write clock signaleffectively configures FIFO 504 to compress the outgoing data since onlyhalf of the data is transferred across paths 420-1 per 2× clock cycle.

Similarly, RX FIFO 510 may be operated in the 1× mode, where signalsrd_clk and wr_clk exhibit the same frequency. Since the read and writeclock frequencies are identical, the data width at the input and outputof FIFO 510 are both set at n/2 in the 1× mode.

In scenarios where the data width at the output of FIFO 510 needs to begreater than n/2, FIFO 510 may be operated in the 2× mode, where signalwr_clk exhibits twice the frequency of signal rd_clk. Configured in thisway, the data width at the output of FIFO 510 is doubled to n, so thedata width across paths 420-2 is effectively cut in half relative to thedata width at the output of FIFO 510. The use of write clock signalwr_clk running at double the corresponding read clock signal rd_clkeffectively configures FIFO 510 to decompress the incoming data streamsince only half of the data is transferred across paths 420-2 per 2×clock cycle.

When adapter circuitry 502 is operated in the 2× mode (i.e., wheneverFIFOs 504 and 510 are transmitting only half of the data word per 2×clock cycle), boundary alignment should be engaged by activating wordmarking logic 512 and word alignment logic 518. Word marking logic 512,which may be inserted at the data input of TX FIFO 504, may append afirst additional bit that marks the lower half of an original word to betransmitted and may add a second additional bit that marks the upperhalf of the original word. Word alignment logic 518, which may beinserted at the write enable input of TX FIFO 510, may then analyze theincoming data stream and reassemble the upper and lower halves togetherto recreate the original word. Boundary alignment may therefore be usedto support 2:1 data compression. Operated in this way, data may beproperly transmitted across paths 420 without requiring any trainingsequence and without adding any latency.

Similarly, daughter die adapter circuitry 504 may include a receive FIFO508 coupled to paths 420-2, word marking logic 516 associated with RXFIFO 508, a transmit FIFO 506 coupled to paths 420-1, and word alignmentlogic 514 associated with the receive FIFO 506. FIFO 506 is referred toherein as a “transmit” FIFO because it is used in the transmit path fromthe perspective of the main die 302. Form the point of view of thedaughter die, however, FIFO 506 can sometimes be considered an RX FIFO.Similarly, FIFO 508 is referred to herein as a “receive” FIFO because itis used in the receive path from the perspective of the main die 302.Form the point of view of the daughter die, however, FIFO 508 cansometimes be considered a TX FIFO.

FIFOs 506 and 508 are each controlled by a write enable signal wr_en, aread enable signal rd_en, a write clock signal wr_clk, and a read clocksignal rd_clk. Similar to that described in connection with adaptercircuitry 502, FIFOs 506 and 508 within adapter circuitry 504 may alsobe configured in 1× mode and 2× mode to selectively compress/decompressdata while engaging boundary alignment only during the 2× mode (e.g., byactivating word alignment logic 514 and word marking logic 516).

FIG. 6 shows how each FIFO circuit in circuitry 502 and 504 may beoperated in at least the 1× mode or 2× mode. When operated in the 1×mode, there is no data width (de)compression, and the FIFO circuitconveys “single” data width n/2 at both its input and output. Whenoperated in the 2× mode, the FIFO circuit either exhibits: (1) doubledata width n at its input and single data width n/2 at its output toprovide compression; or (2) single data width n/2 at its input and“double” data width n at its output to provide decompression. The twomodes therefore provide a flexible data width as far as the core logicon the main die is concerned, which allows the EMIB interface—whichincludes only a fixed number of pins—to support a variety of differentcommunications protocols.

The 1× and 2× modes allow each FIFO circuit to provide a configurabledata width. Depending on the position of the FIFO and the relationshipof the read and write clock signals that are currently being used tocontrol that FIFO, each FIFO may further be configured in one of atleast four different modes:

(1) a phase-compensation mode;

(2) a clock-compensation mode;

(3) an elastic mode; and

(4) a register mode.

See, e.g., FIG. 7 . A FIFO circuit may be configured in thephase-compensation mode when the read and write clock signalscontrolling that FIFO are generated based on the same clock source sothat both clocks either have the same frequency or one clock has afrequency that is an integer multiple of the other. In either scenario,the two clocks may have any mismatched phases, so the FIFO willcompensate for the phase offset and ensure synchronous data transfer.

The FIFO circuit may be configured in the clock-compensation mode whenthe read and write clock signals controlling that FIFO are generatedbased off different clock sources. In this mode, the two clock signalsgenerally exhibit different clock frequencies, so the FIFO willcompensate for the rate difference by opportunistically inserting ordeleting idle symbols (as an example).

The FIFO circuit may also be configured in the elastic mode when theread and write clock signals controlling that FIFO exhibit substantiallydifferent frequencies such that the FIFO might be subject to overflow orunderflow. In this mode, the FIFO may throttle its write when it isalmost full (i.e., by deactivating control signal wr_en) to allow theread port to catch up or may throttle its read when it is almost empty(i.e., by deasserting control signal rd_en) to allow the write port tocatch up. Operated in this way, the elastic mode is similar to theclock-compensation mode with an additional data throttlingfunctionality.

The FIFO circuit may also be configured in the register mode when it isdesired to completely bypass that FIFO. The elastic mode should only beused when the FIFO is operated in the 1× mode. Configured in this way,the FIFO circuit provides low latency, which can help amelioratepotential timing closure issues that may arise when supporting certaincommunications protocols.

FIG. 8 is a diagram showing adapter circuitry 502 and 504 of FIG. 5operated in 1× mode in accordance with an embodiment. As shown in FIG. 8, the read and write clock signals are all “1×” clock signals. In otherwords, all the FIFOs are running at the system clock speed. As describedabove, the boundary alignment circuitry (e.g., the work marking and wordalignment logic circuitry) is deactivated, as indicated by the “X”through each of the respective blocks, and the data width throughout theadapter circuitry is maintained at n/2.

Generally in such scenarios, each of the FIFOs may be configured in thephase-compensation mode, but FIFOs 504 and 510 may optionally beconfigured in the elastic mode. In yet other suitable arrangements,FIFOs 504, 508, and/or 510 may optionally be placed in the registerbypass mode to reduce latency.

FIG. 9 is a diagram showing how adapter circuitry 502 and 504 of FIG. 5operated in 2× mode in accordance with another embodiment. As shown inFIG. 9 , FIFOs 504 and 508 are providing data compression (i.e., theread clock is double the corresponding write clock) while FIFOs 506 and510 are providing data decompression (i.e., the read clock is half thecorresponding write clock). As described above, the boundary alignmentcircuitry (e.g., the work marking and word alignment logic circuitry)may be activated so that the data width to the external environment isdoubled to n while the data width across the EMIB remains at n/2.

As an example, each of FIFOs 504, 506, 508, and 510 may all beconfigured in the phase-compensation mode to support the PCIe standardsuch as the PCIe 3.0 and 4.0 and beyond.

As another example, each of FIFOs 504, 506, and 508 may be configured inthe phase-compensation mode while FIFO 510 is configured in theclock-compensation mode to support the 10 Gigabit Ethernet (10GE)technologies. When supporting the 10G BaseR interconnect, for example,FIFO circuit 510 may be configured in the clock-compensation mode sinceFIFO 510 receives a write clock that is provided from transceiver die304 and a read clock that is provided as a system clock from the coreregion of main die 302.

As yet another example, each of FIFOs 506 and 508 may be configured inthe phase-compensation mode while FIFOs 504 and 510 are configured inthe elastic mode to support the Interlaken networking protocol. Sincethe Interlaken protocol allows the system clock to be overclocked, FIFO504 may throttle incoming data by controlling the write enable signalwr_en to prevent overflow while FIFO 510 may throttle its output bycontrolling the read enable signal rd_en to prevent underflow.

FIG. 10 is a diagram showing how adapter circuitry 502 and 504 of FIG. 5can be used to support a hybrid 1×/2× mode in accordance with anembodiment. As shown in FIG. 10 , adapter circuitry 502 may be operatedin “1×” mode (even though the read and write clocks are both at the 2×clock rate), whereas adapter circuitry 504 may be operated in 2× mode.Boundary alignment on transceiver die 304 may be switched in to use,whereas boundary alignment on main die 302 may be bypassed (as indicatedby the “X” marked through blocks 512 and 518). Configured in this way,main die 302 runs entirely at the 2× clock rate at half (or “single”)data width n/2 while daughter die 304 connects to the EMIB at the 2×clock rate but interfaces with external off-package components at the 1×clock rate at full (or “double”) data width n.

FIG. 11 is a diagram showing how adapter circuitry 502 and 504 of FIG. 5can be implemented to support register mode in accordance with anotherembodiment. As shown in FIG. 11 , a multiplexer 990 and a latch 992(e.g., a digital flip-flop) may be inserted at the output of each FIFOin adapter circuitry 502 and adapter circuitry 504. In particular,multiplexer 990 may have a first input that is coupled to the dataoutput of the associate FIFO, a second input that is coupled to the datainput of the associated FIFO, and an output that is coupled to acorresponding latch 992.

When register mode is deactivated, each multiplexer 990 may beconfigured to route signals from its first input to its output. Whenregister mode is engaged, each multiplexer 990 may be configured toroute signals from its second input to its output. Configured as such,multiplexer 990 effectively bypasses the associated FIFO. In registermode, the boundary alignment circuitry is also switched out of use.

Although not explicitly shown, the embodiments of FIGS. 5 and 8-10 mayalso include multiplexers 990 and latches 992 to support the registermode. If desired, at least one of FIFOs 504, 508, and 510 may beconfigured in register mode during the 1× mode of FIG. 8 . In anothersuitable embodiment, at least one of FIFOs 504 and 510 may be configuredin register mode during the hybrid mode of FIG. 10 .

The examples described herein related to 2:1 data (de)compression ismerely illustrative and does not serve to limit the scope of the presentinvention. In general, the circuitry and techniques described above inconnection with FIGS. 1-11 may be applied to higher compression schemesincluding but not limited to 4× compression schemes, 8× compressionschemes, etc. In such applications, a phase-locked loop or other clockgeneration circuitry may be configured to generate 1×, 2×, 4×, and/or 8×clock signals.

The foregoing is merely illustrative of the principles of this inventionand various modifications can be made by those skilled in the art. Theforegoing embodiments may be implemented individually or in anycombination.

What is claimed is:
 1. A single package multi-die electronic device,comprising: an integrated circuit die having first input/outputcircuitry configured to operate in: a first mode in which a read clocksignal or a write clock signal has a first frequency; and a second modein which the read clock signal or the write clock signal has a secondfrequency that is different than the first frequency; and a second diecommunicatively coupled to the integrated circuit die within the singlepackage multi-die electronic device.
 2. The single package multi-dieelectronic device of claim 1, wherein the second die comprises secondinput/output circuitry and is communicatively coupled to the integratedcircuit die via the second input/output circuitry.
 3. The single packagemulti-die electronic device of claim 2, comprising: a third die havingthird input/output circuitry configured to operate in the first mode andthe second mode; and a fourth die having fourth input/output circuitryconfigured to operate in the first mode and the second mode.
 4. Thesingle package multi-die electronic device of claim 2, wherein thesecond input/output circuitry is configured to operate in the first modeand the second mode.
 5. The single package multi-die electronic deviceof claim 4, wherein the first and second input/output circuitry areconfigured to simultaneous operate in the first mode.
 6. The singlepackage multi-die electronic device of claim 4, wherein the firstinput/output circuitry is configured to operate in the first mode whilethe second input/output circuitry is operating in the second mode. 7.The single package multi-die electronic device of claim 1, wherein theintegrated circuit die is configured to switch between operating in thefirst and second modes.
 8. The single package multi-die electronicdevice of claim 1, wherein: the integrated circuit die is a firstprocessor die; and the second die is a second processor die.
 9. Thesingle package multi-die electronic device of claim 1, wherein: theintegrated circuit die is a programmable logic device; and the seconddie is a transceiver die.
 10. The single package multi-die electronicdevice of claim 1, wherein the read clock signal and the write clocksignal are generated based on a same clock source.
 11. The singlepackage multi-die electronic device of claim 1, wherein the secondfrequency is double the first frequency.
 12. A system, comprising: afirst die of a first single package multi-die device having firstinput/output circuitry; and an integrated circuit die of the firstsingle package multi-die device communicatively coupled to the first dieand having second input/output circuitry, wherein the secondinput/output circuitry is configured to operate in: a first mode inwhich a read clock frequency or a write clock frequency has a firstfrequency; and a second mode in which the read clock frequency or thewrite clock frequency is a second frequency that is double the firstfrequency.
 13. The system of claim 12, comprising a third die of asecond single package multi-die device, wherein the third die comprisesthird input/output circuitry and is communicatively coupled to theintegrated circuit die.
 14. The system of claim 13, wherein the thirdinput/output circuitry is configured to operate in the first mode andthe second mode.
 15. The system of claim 12, wherein: in the first mode,the read clock frequency is the first frequency; and in the second mode,the read clock frequency is the second frequency.
 16. The system ofclaim 12, wherein: in the first mode, the write clock frequency is thefirst frequency; and in the second mode, the write clock frequency isthe second frequency.
 17. The system of claim 12, wherein: the first dieis a first processor die or a transceiver die; and the second die is asecond processor die or a programmable logic device.
 18. A method,comprising: during a first mode of operation, providing a write clocksignal and a read clock signal having a first frequency to input/outputcircuitry of a first die of a single package multi-die electronicdevice; during a second mode of operation, providing a write clocksignal and a read clock signal having different frequencies to theinput/output circuitry of the first die; and transmitting data to orreceiving data from a second die of the single package multi-dieelectronic device.
 19. The method of claim 18, wherein: the input/outputcircuitry comprises a transmit buffer and a receive buffer; and themethod comprises: compressing, via the transmit buffer, data to betransmitted during the second mode operation; decompressing, via thereceive buffer, received data during the second mode of operation; orboth.
 20. The method of claim 18, wherein: the first die is a firstprocessor die or a transceiver die; and the second die is a secondprocessor die or a programmable logic device.